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Signed-off-by: Hayden Laccabue <hlaccabu@amd.com>
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Pull request overview
This PR refactors the shim_test infrastructure to improve maintainability and clarity. It consolidates test binary configuration by moving metadata (ELF names, expected status values) from constructor parameters into a centralized binary_info structure with an extra map field. Test tags are renamed to be more descriptive (e.g., "bad_timeout", "bad_addr", "bad_op" instead of generic "bad").
Changes:
- Added
extrafield tobinary_infostruct for storing additional metadata - Simplified test class constructors by removing redundant parameters and using default arguments
- Renamed test binary tags to be more descriptive of their purpose
- Added std::move optimizations for temporary data
- Removed unused variables and updated comments
Reviewed changes
Copilot reviewed 5 out of 5 changed files in this pull request and generated no comments.
Show a summary per file
| File | Description |
|---|---|
| test/shim_test/dev_info.h | Added extra map field to binary_info struct for metadata storage |
| test/shim_test/dev_info.cpp | Renamed test tags to descriptive names and populated extra field with ELF names and expected values |
| test/shim_test/io.h | Simplified constructor signatures for test classes using default parameters |
| test/shim_test/io.cpp | Updated constructors to read metadata from extra field, added std::move optimizations, updated comments |
| test/shim_test/io_test.cpp | Updated test function calls with new tag names, removed unused variable, added std::move optimization |
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maxzhen
approved these changes
Feb 26, 2026
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