You signed in with another tab or window. Reload to refresh your session.You signed out in another tab or window. Reload to refresh your session.You switched accounts on another tab or window. Reload to refresh your session.Dismiss alert
We have a device using OpENer that passed CT17 certifications a few years ago.
I just updated to the latest OpENer source code (2.3.0) and try to run newer versions of certification tests (CT18 to CT20).
I'm starting to wonder if only CT17 is supported by OpENer.
In fact, I see the two following problems:
Problem 1: LLDP (causing failure of CT19 and CT20)
The Profile verification test fails with:
"*** EtherNet/IP Devices undergoing certification for the first time and multi-port devices receiving an update that adds CIP functionality are required to implement LLDP protocol and LLDP Management Object starting from May 2022"
I don't see support for LLDP Management Object in OpENer source code. Should I assume that the latest certification testing supported by OpENer is CT18?
Problem 2: Electronic Key format 4 (causing failure of CT18, CT19 and CT20)
The Connection manager test fails with:
*** The DUT does not support required Electronic Key Format 4.
I do see some code in OpENer that refers to Electronic Key Format. But is the code complete?
While running the tests, OpENer prints the following error: "wrong path requested".
Function DecodePaddedEPath does not seem to handle LOGICAL_SEGMENT_TYPE_SPECIAL.
For the records, the Path requested by the CT18 tool is: "34 04 1d 06 2b 00 f4 01 02 03".
It fails at first part which should mean: 0x34 (Electronic Key Segment) (VendorID: 0x061D, DevTyp: 0x002B, 2.3)
Is that a known issue with OpENer?
Is Electronic key format 4 supposed to be supported?
reacted with thumbs up emoji reacted with thumbs down emoji reacted with laugh emoji reacted with hooray emoji reacted with confused emoji reacted with heart emoji reacted with rocket emoji reacted with eyes emoji
-
We have a device using OpENer that passed CT17 certifications a few years ago.
I just updated to the latest OpENer source code (2.3.0) and try to run newer versions of certification tests (CT18 to CT20).
I'm starting to wonder if only CT17 is supported by OpENer.
In fact, I see the two following problems:
Problem 1: LLDP (causing failure of CT19 and CT20)
The Profile verification test fails with:
"*** EtherNet/IP Devices undergoing certification for the first time and multi-port devices receiving an update that adds CIP functionality are required to implement LLDP protocol and LLDP Management Object starting from May 2022"
I don't see support for LLDP Management Object in OpENer source code. Should I assume that the latest certification testing supported by OpENer is CT18?
Problem 2: Electronic Key format 4 (causing failure of CT18, CT19 and CT20)
The Connection manager test fails with:
*** The DUT does not support required Electronic Key Format 4.
I do see some code in OpENer that refers to Electronic Key Format. But is the code complete?
While running the tests, OpENer prints the following error: "wrong path requested".
Function DecodePaddedEPath does not seem to handle LOGICAL_SEGMENT_TYPE_SPECIAL.
For the records, the Path requested by the CT18 tool is: "34 04 1d 06 2b 00 f4 01 02 03".
It fails at first part which should mean: 0x34 (Electronic Key Segment) (VendorID: 0x061D, DevTyp: 0x002B, 2.3)
Is that a known issue with OpENer?
Is Electronic key format 4 supposed to be supported?
Beta Was this translation helpful? Give feedback.
All reactions